Tight-binding analysis of surface electronic conduction measured with micro-multipoint scanning tunneling microscopy probes

論文・著書情報

タイトル

和文:	Tight-binding analysis of surface electronic conduction measured with micro-multipoint scanning tunneling microscopy probes
英文:	Tight-binding analysis of surface electronic conduction measured with micro-multipoint scanning tunneling microscopy probes

著者

和文:	R SUZUKI, M NODA, T TADA, S WATANABE.
英文:	R SUZUKI, M NODA, T TADA, S WATANABE.

言語

English

掲載誌/書名

和文:	JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS
英文:	JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS

巻, 号, ページ

Vol. 45 pp. 2136-2139

出版年月

2006年

出版者

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英文:

会議名称

和文:
英文:

開催地

和文:
英文:

DOI