"Takumi Uezono,Tomoyuki Takahashi,Michihiro Shintani,Kazumi Hatayama,Kazuya Masu,Hiroyuki Ochi,Takashi Sato","Scan Based Process Parameter Estimation Through Path-Delay Inequalities","IEEE International Symposium on Circuits and Systems (ISCAS 2010)","IEEE International Symposium on Circuits and Systems (ISCAS 2010)","IEEE International Symposium on Circuits and Systems (ISCAS 2010)",,,,2010,June