"K. Kakushima,Yuta Ikeuchi,T. Hoshii,I. Muneta,H. Wakabayashi,K. Tsutsui,H. Iwai,T. Kikuchi,S. Ishikawa","Low Temperature Ohmic Contact for p-type GaN using Mg Electrodes","Int. Workshop on Junction Technology (IWJT2017)",,,,,,2017,June
"Y. Ikeuchi,T. Hoshii,H. Wakabayashi,K. Tsutsui,H. Iwai,K. Kakushima,S.Ishikawa","Characteristics of Fe/pGaN Contact upon Annealing Process","47th IEEE Semiconductor Interface Specialists Conference (SISC2016)",,,,,,2016,Dec.