論文

• OSAMI SAKATA, Min-Su Yi, Akifumi Matsuda, Jin Liu, Shuhei Sato, Shusaku Akiba, Atsushi Sasaki. Structural analysis of NiO ultra-thin films epitaxially grown on ultra-wmooth sapphire substrates by synchrotron X-ray diffraction measurements, Applied Surface Science, Elsevier, Vol. 221, 450-454, Jan. 2004.
• OSAMI SAKATA, Masaki Takata, Hiroyoshi Suematsu, Akifumi Matsuda, Shusaku Akiba, Atsushi Sasaki. High-energy X-ray Scattering in Grazing Incidence from Nanometer-scale Oxide Wires, Appl. Phys. Lett., Vol. 84, No. 21, pp. 4239-4241, 2004.

国際会議発表 (査読なし・不明)

• T. Kato, T.Inamura, A.Sasaki, K.Aoki, K.Kakushima, Y.Kataoka, A. Nishiyama, N. Sugii, H.Wakabayashi, K. Tsutsui, K. Natori, H. Iwai. Thickness-dependent electrical characterization of β‐FeSi2, The Workshop on Future Trend of Nanoelectronics: WIMNACT 39, Feb. 2014.

学位論文

• レーザーＭＢＥ法による酸化物原子層制御とエピタキシャル成長のイオン散乱分光その場解析,  Master of Engineering,  Tokyo Institute of Technology,  2002/--/--, 

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