@article{CTT100604865,
  author = {Takumi Uezono and Kazuya Masu and Takashi Sato},
  title = {A Time-Slicing Ring Oscillator for Capturing Time-Dependent Delay Degradation and Power Supply Voltage Fluctuation},
  journal = {IEICE Transactions on Fundamentals of Electronics},
  year = 2010,
}

@article{CTT100575059,
  author = {Takumi Uezono and Takashi Sato and Kazuya Masu},
  title = {One-Shot Voltage-Measurement Circuit Utilizing Process Variation},
  journal = {IEICE Transactions on Fundamentals of Electronics},
  year = 2009,
}

@article{CTT100564771,
  author = {Shiho Hagiwara and Takumi Uezono and Takashi Sato and Kazuya Masu},
  title = {Application of Correlation-based Regression Analysis for Improvement of Power Distribution Network},
  journal = {IEICE Transactions on Fundamentals of Electronics},
  year = 2008,
}

@inproceedings{CTT100607559,
  author = {Takumi Uezono and Tomoyuki Takahashi and Michihiro Shintani and Kazumi Hatayama and Kazuya Masu and Hiroyuki Ochi and Takashi Sato},
  title = {Scan Based Process Parameter Estimation Through Path-Delay Inequalities},
  booktitle = {IEEE International Symposium on Circuits and Systems (ISCAS 2010)},
  year = 2010,
}

@inproceedings{CTT100607561,
  author = {Takashi Sato and Takumi Uezono and Noriaki Nakayama and Kazuya Masu},
  title = {Decomposition of Drain-Current Variation Into Gain-Factor and Threshold Voltage Variations},
  booktitle = {IEEE International Symposium on Circuits and Systems (ISCAS 2010)},
  year = 2010,
}

@inproceedings{CTT100592695,
  author = {Tomoyuki Takahashi and Takumi Uezono and Michihiro Shintani and Kazuya Masu and Takashi Sato},
  title = {On-die parameter extraction from path-delay measurements},
  booktitle = {2009 IEEE Asian Solid-State Circuits Conference},
  year = 2009,
}

@inproceedings{CTT100604868,
  author = {Michihiro Shintani and Takumi Uezono and Tomoyuki Takahashi and Hiroyuki Ueyama and Takashi Sato and Kasumi Hatayama and Takashi Aikyo and Kazuya Masu},
  title = {An Adaptive Test for Parametric Faults Based on Statistical Timing Information},
  booktitle = {IEEE Asian Test Symposium},
  year = 2009,
}

@inproceedings{CTT100604892,
  author = {高橋知之 and 上薗巧 and 越智裕之 and 益一哉 and 佐藤高史},
  title = {パス遅延測定によるチップ特性の推定手法},
  booktitle = {DAシンポジウム},
  year = 2009,
}

@inproceedings{CTT100577064,
  author = {伊達貴徳 and 萩原 汐 and 上薗 巧 and 佐藤高史 and 益 一哉},
  title = {SRAM回路の構造的対称性を考慮した2段階学習型重点的サンプリング},
  booktitle = {VLSI設計技術研究会 システム設計及び一般，信学技報},
  year = 2009,
}

@inproceedings{CTT100590958,
  author = {新谷 道広 and 高橋 知之 and 植山 寛之 and 上薗 巧 and 佐藤 高史 and 畠山 一実 and 相京 隆 and 益 一哉},
  title = {統計的タイミング情報に基づく適応型テスト},
  booktitle = {2009 年 電子情報通信学会総合大会},
  year = 2009,
}

@inproceedings{CTT100590959,
  author = {上薗 巧 and 高橋 知之 and 植山 寛之 and 新谷 道広 and 佐藤 高史 and 益 一哉},
  title = {適応型テストにおけるクリティカルパスのクラスタリング手法},
  booktitle = {2009 年 電子情報通信学会総合大会},
  year = 2009,
}

@inproceedings{CTT100570737,
  author = {上薗巧 and 佐藤高史 and 益 一哉},
  title = {プロセスばらつきの積極的活用による非繰返し電圧波形の測定},
  booktitle = {第21回 回路とシステム軽井沢ワークショップ},
  year = 2008,
}

@inproceedings{CTT100544499,
  author = {上薗巧 and 佐藤高史 and 益一哉},
  title = {電源電圧降下の時間的・空間的広がり可視化手法},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544511,
  author = {上薗巧 and 佐藤高史 and 益一哉},
  title = {電源電圧降下の時間的・空間的広がり可視化回路},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544462,
  author = {Takashi Sato and Shiho Hagiwara and Takumi Uezono and Kazuya Masu},
  title = {Weakness identification for effective repair of power distribution network},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544490,
  author = {萩原汐 and 上薗巧 and 佐藤高史 and 益 一哉},
  title = {相関係数にもとづく回帰分析の電源改善への適用},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544481,
  author = {天川 修平 and 上薗 巧 and 佐藤 高史 and 益 一哉},
  title = {セル間接続方向限定性とセル配置粗密性を考慮した配線長分布},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544480,
  author = {萩原 汐 and 上薗 巧 and 佐藤 高史 and 益 一哉},
  title = {電源電圧降下の相関を用いる電源網の定量的評価},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544457,
  author = {Takashi Sato and Takumi Uezono and Shiho Hagiwara and Kenichi Okada and Shuhei Amakawa and Noriaki Nakayama and Kazuya Masu},
  title = {A MOS transistor-array for accurate measurement of subthreshold leakage variation},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544454,
  author = {Shiho Hagiwara and Takumi Uezono and Takashi Sato and Kazuya Masu},
  title = {Improvement of power distribution network using correlation-based regression analysis},
  booktitle = {},
  year = 2007,
}