@inproceedings{CTT100609246,
  author = {K. Fushinobu and Y. Yamamoto and T. Hatakeyama},
  title = {Scaling consideration on local hotspot for Si MOSFETs - For device length scale typically larger than 100 nm},
  booktitle = {Proc. ITherm 2010},
  year = 2010,
}

@inproceedings{CTT100591714,
  author = {Yasufumi Yamamoto and T. Hatakeyama and K. Fushinobu and K. Okazaki},
  title = {Heat generation characteristics in Si MOSFETs for the device-level thermal management - Effect of the device scaling and transport properties},
  booktitle = {Proc. 7th CHE Conference},
  year = 2009,
}

@inproceedings{CTT100566432,
  author = {Yasufumi Yamamoto and Tomoyuki Hatakeyama and Kazuyoshi Fushinobu and Ken Okazaki},
  title = {Electro-Thermal Analysis for Compact Heat Generation Model of Si MOSFET},
  booktitle = {},
  year = 2008,
}

@inproceedings{CTT100557016,
  author = {山本泰史 and 畠山友行 and 伏信一慶 and 岡崎健},
  title = {Si MOSFETにおけるコンパクト発熱モデルのための熱・電気連成解析},
  booktitle = {第４５回日本伝熱シンポジウム講演論文集},
  year = 2008,
}