論文

• Yoshitaka Ehara, Takaaki Nakashima, Daichi Ichinose, Shimizu Takao, Takahisa Shiraishi, OSAMI SAKATA, Tomoaki Yamada, Shintaro Yasui, ken nishida, HIROSHI FUNAKUBO. Film thickness dependence of in-plane ferroelastic domain structure in constrained tetragonal PbTiO3 films induced by isotropic tensile strain, Appl. Phys. Lett., 121, 262901, Dec. 2022.
• Anli Yang, Osami Sakata, Ryosuke Yamauchi, LOKU SINGGAPPULIGE, Rosantha Kumara, Chulho Song, Yoshio Katsuya, Akifumi Matsuda, Mamoru Yoshimoto. Atomic disorder of Li_0.5Ni_0.5O thin films caused by Li doping: estimation from X-ray Debye-Waller factors, Journal of Applied Crystallography, International Union of Crystallography, Volume 48, # 6, Page 1896-1900, Dec. 2015.  公式リンク  
  
• Anli Yang, Osami Sakata, Ryosuke Yamauchi, Yoshio Katsuya, L.S.R. Kumara, Yoshitomo Shimada, Akifumi Matsuda, Mamoru Yoshimoto. Lattice spacings and domain sizes of room-temperature epitaxial LixNi1-xO (0 < x < 0.48) thin films grown on ultra-smooth sapphire substrates, Appl. Surf. Sci., Vol. 320, pp. 787–790, Nov. 2014.  公式リンク  
  
• Miki Noda Fukuya, Kazunobu Senoo, Masaru Kotera, Mamoru Yoshimoto, Osami Sakata. Enhanced oxygen barrier property of poly(ethylene oxide) films crystallite-oriented by adding cellulose single nanofibers, Polymer, Vol. 55, pp. 5843–5836, Oct. 2014.  公式リンク  
  
• M. Noda Fukuya, K. Senoo, M. Kotera, M. Yoshimoto, O. Sakata. Controlling of crystallite orientation for poly(ethylene oxide) thin films with cellulose single nano-fibers, Polymer, Vol. 55, pp. 4401-4404, Aug. 2014.  公式リンク  
  
• L. S. R. Kumara, Osami Sakata, Anli Yang, Ryosuke Yamauchi, Munetaka Taguchi, Akifumi Matsuda, Mamoru Yoshimoto. Hard X-ray photoelectron spectroscopy of LixNi1-xO epitaxial thin films with a high lithium content, J. Chem. Phys., Vol. 141, pp. 044718(1)–(4), July 2014.  公式リンク  
  
• Seiji Nakashima, Hironori Fujisawa, M. Shimizu, OSAMI SAKATA, Tomoaki Yamada, HIROSHI FUNAKUBO, Jung Min Park, Takeshi Kanashima, Masanori Okuyama. X-ray Diffraction Study of Electric-field-induced Strains in Polycrystalline BiFeO3 Thin Films at Low Temperatures by Using Synchrotron Radiation, J. Korean Phys. Soc., Vol. 59(3), pp. 2556-2559, 2011.
• Y. Ehara, S. Yasui, J. Nagata, D. Kan, V. Anbusathaiah, T. Yamada, OSAMI SAKATA, H. Funakubo, V. Nagarajan. Ultrafast Switching of Ferroelastic Nanodomains in Bilayered Ferroelectric Thin Films, Appl. Phys. Lett., Vol. 99, pp. 182906-1-3, 2011.
• Osami Sakata, Takayuki Watanabe, Hiroshi Funakubo. Identification of crystal symmetry of Bi4Ti3O12 epitaxial thin films with (100)/(010) orientations by amodifiedmethod of synchrotron-based reciprocal-space mapping, J. Appl. Cryst., Vol. 44, pp. 385–391, 2011.
• Tomoaki Yamada, Jin Wang, Osami Sakata, Hidenori Tanaka, Yoshitaka Ehara, Shintaro Yasui, Nava Setter, Hiroshi Funakubo. Structural Property and Electric Field Response of a Single Perovskite PbTiO3 Nanowire Using Micro X-ray Beam, Jpn. J. Appl. Phys., Vol. 49(9), pp. 09MC09-1-4, 2010.
• O. Sakata, S. Yasui, T. Yamada, M. Yabashi, S. Kimura, H. Funakubo. In-situ lattice-strain analysis of a ferroelectric thin film under an applied pulse electric field, AIP Conf. Proc., Vol. 1234, pp. 151155, 2010.
• Tomoaki Yamada, Jin Wang, Osami Sakata, Cosmin S. Sandu, Zhanbing He, Takafumi Kamo, Shintaro Yasui, Nava Setter, Hiroshi Funakubo. Synchrotron X-ray Diffraction Study on a Single Nanowire of PX-Phase Lead Titanate, J. Euro. Ceram. Soc., Vol. 30, pp. 3259–3262, 2010.
• Shintaro Yasui, OSAMI SAKATA, Mitsumasa Nakajima, Satoru Utsugi, Keisuke Yazawa, Tomoaki Yamada, HIROSHI FUNAKUBO. Piezoelectric Properties of {100}-oriented Epitaxial BiCoO3–BiFeO3 Films Measured using Synchrotron X-ray Diffraction, Jpn. J. Appl.Phys., Vol. 48, pp. 09KD06-1-4, 2009.
• Hiroshi Nakaki, Yong Kwan Kim, Shintaro Yokoyama, Rikyu Ikariyama, Hiroshi Funakubo, Ken Nishida, Keisuke Saito, Hitoshi Morioka, Osami Sakata. Strain-relaxed structure in (001)/(100)-oriented epitaxial Pb(Zr,Ti)O3 films grown on (100) SrTiO3 substrates by metal organic chemical vapor deposition, J. Appl. Phys., Vol. 105, No. 014107, pp. 1-5, 2009.
• Yusaburo Ono, Yushi Kato, Yasuyuki Akita, Makoto Hosaka, Naoki Shiraishi, Makoto Yamaguchi, Osami Sakata. Fabrication of Electrically Active Si-based Thin Films by Pulsed Laser Deposition of SiO/C Dual Targets, Mater. Res. Soc. Symp. Proc., Vol. 1148, 2009.
• Y. Akita, Y. Sugimoto, M. Hosaka, Y. Kato, Y. Ono, OSAMI SAKATA, M. Mita, H. Oi. Fabrication and Characterization of Indium Tin Oxide Thin Films on Nanoimprinted Glasses, Mater. Res. Soc. Symp. Proc., Vol. 1109, pp. 1109-B06-12, 2009.
• Y. Akita, Y. Sugimoto, M.Mita, H.Oi, OSAMI SAKATA. Fabrication of Nanostructured ITO Thin Films on Nanoimprinted Glasses by Pulsed Laser Deposition, Proc. SPIE, 7201, 72011A, 2009.
• ken nishida, takashi yamamoto, Minoru Osada, OSAMI SAKATA, Shigeru Kimura, Keisuke Saito, Masamichi Nishide, Takashi Katoda, Shintaro Yokoyama, HIROSHI FUNAKUBO. Orientation controlled deposition of Pb(Zr,Ti)O3 films using micron-size patterned SrRuO3 buffer layer, J. Mater.Sci., Vol. 44, pp. 5339-5344, 2009.
• Osami Sakata, J. M. Soon, Akifumi Matsuda, Yasuyuki Akita. Transformation from an atomically stepped NiO thin film to a nanotape structure: A kinetic study using x-ray diffraction, Applied Physics Letters, American Institute of Physics, Vol. 93, No. 24, 241904, Dec. 2008.
• Seiji Nakashima, Osami Sakata, Yoshitaka Nakamura, Takeshi Kanashima, Hiroshi Funakubo, Masanori Okuyama. X-ray diffraction study of polycrystalline BiFeO3 thin film under electric field, Apply. Phy. Lett., Vol. 93, pp. 042907-1-3, 2008.
• Katsuhiko Kanaizuka, Rie Haruki, OSAMI SAKATA, YASUYUKI AKITA, Hiroshi Kitagawa. Construction of Highly Oriented Crystalline Surface Coordination Polymers Composed of Copper Dithiooxamide Complexes, J. Am. Chem. Soc., Vol. 130, pp. 15778, 2008.
• Kenji Takahashi, Muneyasu Suzuki, Takashi Kojima, Takayuki Watanabe, Yukio Sakashita, Kazumi Kato, OSAMI SAKATA, Kazushi Sumitani, Hiroshi Funakubo. Thickness Dependence of Dielectric Properties in Bismuth Layer-structured Dielectrics, Appl. Phys. Lett., Vol. 89, 082901-1-3., 2006.
• Yong Kwan Kim, Shintaro Yokoyama, Risako Ueno, Hitoshi Morioka, OSAMI SAKATA, Shigeru Kimura, Keisuke Saito, Hiroshi Funakubo. Observation of Domain Switching in Fatigued Epitaxial Pb(Zr,Ti)O3 Thin Films, Mater. Res. Soc. Symp. Proc., Vol. 902E, pp. 0902-T10-67.1-6., 2006.
• Shintaro Yokoyama, Kenji Takahashi, Shoji Okamoto, Atsushi Nagai, Jun Minamidate, Keisuke Saito, Naoki Ohashi, Hajime Haneda, Osami Sakata, Shigeru Kimura, Ken Nishida, Takashi Katoda, Hiroshi Funakubo. Preparation and Structural Analysis of Micro-patterned Pb(Zr,Ti)O3 Film by Metalorganic Chemical Vapor Deposition, Jpn. J. Appl. Phys., Vol. 45, No. 6A, pp. 5102-5106., 2006.
• Shintaro Yokoyama, Yoshihisa Honda, Hitoshi Morioka, Shoji Okamoto, Takashi Iijima, Hirofumi Matsuda, Keisuke Saito, Takashi Yamamoto, Hirotake Okino, OSAMI SAKATA, Shigeru Kimura, Hiroshi Funakubo. Dependence of electrical properties of epitaxial Pb(Zr,Ti)O3 thick films on crystal orientation and Zr/(Zr+Ti) ratio, Journal of Applied Physics, Vol. 98, pp. 094106, 2005.
• OSAMI SAKATA, Min-Su Yi, Akifumi Matsuda, Jin Liu, Shuhei Sato, Shusaku Akiba, Atsushi Sasaki. Structural analysis of NiO ultra-thin films epitaxially grown on ultra-wmooth sapphire substrates by synchrotron X-ray diffraction measurements, Applied Surface Science, Elsevier, Vol. 221, 450-454, Jan. 2004.
• Osami Sakata, Akiko Kitano, Wataru Yashiro, Kunihiro Sakamoto, Kazushi Miki, Akifumi Matsuda, Wakana Hara, Shusaku Akiba. Reciprocal –lattice Space Imaging of X-ray Intensities Diffracted from Nanowires, Mater. Res. Soc. Symp. Proc., Vol. 840, Q6.4.1, 2004.
• OSAMI SAKATA, Masaki Takata, Hiroyoshi Suematsu, Akifumi Matsuda, Shusaku Akiba, Atsushi Sasaki. High-energy X-ray Scattering in Grazing Incidence from Nanometer-scale Oxide Wires, Appl. Phys. Lett., Vol. 84, No. 21, pp. 4239-4241, 2004.
• OSAMI SAKATA, Nobuyuki Matsuki, Hiroo Hashizume. In-plane Structure of an Arsenic-adsorbed Si (001) Surface Probed with Grazing-angle X-ray Standing Waves, Phys. Rev. B, vol. 60, pp. 15546-15549, 1999.
• M.K Sanyal, A Datta, A.K Srivastava, B.M Arora, S Banerjee, P Chakraborty, F Caccavale, OSAMI SAKATA, Hiroo Hashizume. Interfacial profile of a Bragg Mirror, Appl. Surf. Sci., Vol. 133, pp. 98–102, 1998.
• Hiroo Hashizume, Naoki Ishimatsu, OSAMI SAKATA, N. Hosoito, T. Iizuka, Kazumichi Namikawa, Toshiaki Iwazumi, L. E. Berman, G. Srajer, C. T. Venkataraman, J. C. Lang, C. S. Nelson, K. B. Lee, D. R. Lee. Resonant X-ray Magnetic Scattering from the Twisted States of an Fe/Gd Multilayer, Physica B, 248, 133, 1998.
• OSAMI SAKATA, Y. Tanaka, A. M. Nikolaenko, Hiroo Hashizume. Ultrahigh Vacuum Facility for High-resolution Grazing-angle X-ray Diffraction at a Vertical Source of Synchrotron Radiation, J. Synchrotron Radiation, vol. 5, pp. 1222-1226, 1998.
• OSAMI SAKATA. X-ray circular dichroic Bragg reflections from a GdCo/Ag multilayer, Jpn. J. Appl. Phys., Vol. 36, pp. 4525-4530, 1997.
• OSAMI SAKATA. Inter-facial roughness of Si┣D21-X┫D2 Gex/Si multilayer structures on Si(111) probed by X-ray scatlering, J. Phys. : Condens. Matter, Vol. 9, pp. 4521-4533, 1997.
• OSAMI SAKATA, Hiroo Hashizume. Application of Grazing-angle X-ray Standing Waves to the In-plane Structure of a 100 Å -thick Epitaxial Film, Acta Cryst., A53, 781, 1997.
• OSAMI SAKATA. Structre Analysis of the As-deposited Si(100) Surface Using Grazing-Angle X-ray Standing Waves, Report of RLEMTIT,Tokyo Inst,ofTechnology, Vol. 21, pp. 37-41, 1996.
• OSAMI SAKATA. Anomalous dispersion X-ray reflectometry for model-independent determination of Al/C multilayer structures, Physica B, Vol. 221, pp. 416-419, 1996.
• OSAMI SAKATA. Properties of grazing-angle X-ray standing waves and their application to arsenic-deposited Si (111) 1×1 surface, Acta. Cryst., Vol. A51, pp. 375-384, 1995.
• OSAMI SAKATA. Application of the maximum-entropy method to the calculation of electron densities of the Si(111) 7×7 surface from x-ray diffraction data, Report RLEMTIT, No. 20, pp. 53, 1995.
• OSAMI SAKATA, Hiroo Hshizume. Ultrahigh Vacuum Diffractometer for Grazing-angle X-ray Standing Wave Experiments at a Vertical Wiggler Source, Rev. Sci. Instrum., 66, 1364, 1995.
• OSAMI SAKATA. Mapping og two-dimensional lattice distortions in silicon crystals at submicrometer resolution from X-ray rocking-curve data, J. Appl. Cryst, Vol. 27, pp. 338-344, 1994.
• OSAMI SAKATA. Determination of microroughness of polished Si (100) surfaces by X-ray reflectivity measurements, Report RLEMTIT, Vol. 18, pp. 25-37, 1993.
• OSAMI SAKATA. Structure of fluoride/GaAs (111) heteroepitaxial interfaces, Surf. Sci., Vol. 282, pp. 342-356, 1993.
• OSAMI SAKATA. In-plane structure of arsenic deposited in the Si (III) surface studied with the grazing-angle X-ray standing-wave method, Phys. Rev. B, Vol. 48, pp. 11408-11411, 1993.
• OSAMI SAKATA. X-ray evaluation of microroughness of mechano chemically pollishid silicon surfaces, Jpn. J. Appl. Phys, Vol. 32, pp. 616-619, 1993.
• OSAMI SAKATA. Backreflection X-ray Standing Waves and Crystal Truncation Rods as Structure Probr for Epilayer-Substrate Systems, Rev.Sci.Instrum, Vol. 63, pp. 1142-1145, 1992.
• OSAMI SAKATA. Dynamical X-ray Diffraction from Epilayer-Substrate Systems in Grazing-Incidence Bragg Reflection, Report RLEMTIT, pp. 16, 1991.
• OSAMI SAKATA. Design and Commissioning of a UHV Sample Preparation System for X-ray Surface Diffraction, Report RLEMTIT, pp. 15, 1990.
• OSAMI SAKATA, Hiroo Hashizume. Dynamical X-ray Diffraction from Crystals under Grazing-incidence Conditions, Collop. Phys., C-7, 225, 1989.
• OSAMI SAKATA. Dynamical X-ray Diffraction Profiles for Asymetric Reflection from Crystal under Grazing Indicence Conditions, Jpn. J. Appl. Phys, pp. 27, 1988.
• OSAMI SAKATA. Wave Field and Evanescent Waves in Dynamical X-ray Diffraction at Grazing Incidence, Report RLEMTIT, pp. 12, 1987.

国際会議発表 (査読有り)

• Akifumi Matsuda, Seo Okkyun, Osami Sakata, Mamoru Yoshimoto. Room-temperature epitaxy and optoelectronic properties of heavily doped Ni1–xFexO thin films, Materials Research Meeting 2019, Dec. 2019.  公式リンク  
  
• Akifumi Matsuda, Yoshiharu Shinozaki, Seo Okkyun, Osami Sakata, Satoru Kaneko, Yoshisato Kimura, Mamoru Yoshimoto. Effect of Heavy Doping of Aliovalent Cations on Structure and Thermoelectric Properties of NiO-Based Epitaxial Thin Films, 2019 MRS Fall Meeting & Exhibit, Dec. 2019.  公式リンク  
  
• Akifumi Matsuda, Seo Okkyun, Osami Sakata, Satoru Kaneko, Mamoru Yoshimoto. Room-temperature epitaxy and optoelectronic properties of heavily doped NiO thin films, The 13th Pacific Rim Conference of Ceramic Societies, Oct. 2019.  公式リンク  
  
• Ryosuke Yamamoto, Hazuki Morisaki, Osami Sakata, Hidekazu Shimotani, Hongtao Yuan, Yoshihiro Iwasa, Tsuyoshi Kimura, Yusuke Wakabayashi. External Electric Field Dependence of the Structure of the Electric Double Layer at an Ionic Liquid/Au Interface, Appl. Phys. Lett., Vol. 101, pp. 053122, Aug. 2012.

国際会議発表 (査読なし・不明)

• Hiroshi Funakubo, Kenji Takahashi, Muneyasu Suzuki, Takashi Kojima, Takayuki Watanabe, Kazumi Kato, Yukio Sakashita, Kazushi Sumitani, Osami Sakata. “Degradation Free Characteristics of c-axis Oriented Bismuth Layer-Structured Dielectrics”, International Symposium on Integrated Ferroelectrics (ISIF 2007), Vol. 4A-70-I, p. 30, May 2007.

国内会議発表 (査読なし・不明)

• 池谷侑紀, 土嶺信男, 金子 智, Okkyun Seo, 坂田 修身, 松田 晃史, 吉本 護. 岩塩型Ni_1-XFe_XO薄膜の室温エピタキシャル成長と特性評価, 2018年 第79回 応用物理学会秋季学術講演会, Sept. 2018.  公式リンク  
  
• OSAMI SAKATA. Dynamical X-ray diffraction from perfect crystals under total external reflection conditions and its applications to surface researches, Rev. Sci. Instrum, Vol. 60, pp. 2373-2375, 1989.

学位論文

• 微小角Ｘ線定在波法の開発とその結晶表面・界面構造解析への応用,  本文,  Doctor of Engineering,  東京工業大学,  1994/--/--, 

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